Mini-project
Electronics, Semiconductors & Telecom
Device test log extractor
Turn device test logs into structured pass/fail results with failure codes.
The brief
Production test stations write long text logs, and engineers grep them by hand. Build an extractor that turns each log into a structured record (device ID, tests run, measured values, pass/fail, failure code), validates it, and summarises failures. Good looks like: a schema, validation against test limits, and accuracy on 30 labelled logs.
What you will build
- Write realistic test logs from sensor data
- Define the result schema and test limits
- Extract with parsing rules and an LLM; compare
- Validate values against limits
- Summarise failures by code
Free, open data to build it with
Check each dataset's licence before you publish your work. Your mentor gives your team its own version of the brief (data, scope or region), so every team's project is its own.