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IND-ELC · Advanced

AI in electronics, semiconductors and telecom

Yield, test and quality in electronics manufacturing, and network analytics in telecom: wafer-map defects, anomaly detection, churn and network optimisation.

Self-study hours
31
Class hours
27 (14 at beginner depth)
Lessons
9
Free certifications
0
Library resources
8

✓ All 9 lessons expert reviewed

What you will be able to do

  • Analyse manufacturing test and yield data
  • Classify wafer-map and board defects with machine learning
  • Predict churn and detect network faults in telecom data

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