IND-ELC · Advanced
AI in electronics, semiconductors and telecom
Yield, test and quality in electronics manufacturing, and network analytics in telecom: wafer-map defects, anomaly detection, churn and network optimisation.
- Self-study hours
- 31
- Class hours
- 27 (14 at beginner depth)
- Lessons
- 9
- Free certifications
- 0
- Library resources
- 8
✓ All 9 lessons expert reviewed
What you will be able to do
- Analyse manufacturing test and yield data
- Classify wafer-map and board defects with machine learning
- Predict churn and detect network faults in telecom data
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