Statistical process control for a production line

The brief

A semiconductor fab changed a process setting and the yield looks better. Build control charts for key process signals, find when the process went out of control, and test with statistics whether the change really improved the pass rate. Good looks like: correct control limits, out-of-control rules applied, and a test result with its uncertainty.

What you will build

1. Explore the process signals and the pass/fail outcome
2. Build X-bar, R and p control charts
3. Apply Western Electric rules to flag out-of-control periods
4. Test the before-and-after yield difference
5. Write a short quality report

Free, open data to build it with

• SECOM semiconductor manufacturing ↗ UCI Machine Learning Repository

Check each dataset's licence before you publish your work. Your mentor gives your team its own version of the brief (data, scope or region), so every team's project is its own.